V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. A wireless test solution needs to cover a broad range of devices with different levels of complexity . 0000007267 00000 n is an international dealer of Automatic Test Equipment used in the semiconductor and printed circuit board manufacturing process. E-mail Admin : [email protected]. 0000006892 00000 n Advantest Corporation Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing. The result: excellent mechanical and electrical contact is assured. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. DUT boards can be exchanged, as well as test programs. Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. The platform has become the all purpose reference platform. V93000 Visionary and Enduring Architecture. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. 0000031694 00000 n The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. With it's breakthrough Direct Probe probe card interface technology the V93000 offers 4 times the component space on the probe card with optimal signal integrity to allow known good die testing with higher multisite already at probe. The PowerMUX card offers a "sea of switches" for individual usage in typical power applications. The V93000 Smart Scale Generation introduces cards with new capabilities that efficiently increase test coverage, improve time-to-market and deliver superior test economics: The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. trailer <<6AB4174DC18148BAAEFE70E1956D9BEA>]/Prev 523764>> startxref 0 %%EOF 83 0 obj <>stream in a choice of compact, small or large testhead, DUT board reuse and use of the same docking hardware and positioning, which results in a consistent prober and handler setup on the test floor. Smart Test, Smart ATE, Smart Scale. Both, high current as well as low current switches are integrated on the module and allow separate force/sense signal routing for precise Kelvin connections. 0000015761 00000 n The information in the materials on this Web site speaks as of the date issued. Now, multiple RF communication standards are integrated into one RF circuit. 0000079792 00000 n 0000058601 00000 n TSE: 6857. 0000085770 00000 n TSE: 6857. Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. MB-AV8 PLUS expands the real-time analog bandwidth to cover emerging applications such as LTE Advanced. PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. Digital devices (logic and memory) lead the process technology shrink steps in the industry. Smarter Testing ADVANTEST's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. 0000002809 00000 n Each channel can provide up to 80V and 10 amps. Theme by spirit halloween lol costume. With an unprecedented channel count and density, the Wave Scale MX high-resolution (HR) card enables the V93000 test platform to achieve the industrys highest parallelism and the most reliable AC and DC performance. Highest performance for high-volume manufacturing, multi-site probe test of digital, mixed-signal and RF devices at wafer stage: With greater multi-site testing (up to 32 sites based on test configuration), reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. 0000061569 00000 n Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. The V93000 digital test solutions are based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. During card clamp operation, Direct-Probe Bridge Beam pushes and holds probe card alignment pins to the datum point, and constraints XY card movement. 11 0 obj <> endobj xref 11 73 0000000016 00000 n The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. The V93000 digital test solution is based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. 0000058497 00000 n Direct Probeis mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. Semiconductor test equipment supplier Advantest has introduced the newest generation of its Wave Scale RF channel cards for the V93000 platform to address the growing market demand for Wi-Fi 6E, 5G-NR transceivers, LTE-Advanced Pro and IoT communication devices operating at frequencies up to 8GHz. Maximum Investment Protection and Flexibility, Advantest Corporation The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. Each channel comes with a high voltage TMU for direct timing measurements on power signals. Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . 0000031852 00000 n computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. Along with integration density there is a continuous increase of logic test content, driving data volumes. Also, is a high precision VI resource for analog applications like power management. The class determines the possible size of the configuration and allows to fit the size and performance of the tested device. Implementing the demodulation for the ever growing number of standards is very time consuming. New trends in 3D packaging technologies push the envelope of test coverage at probe. 0000349795 00000 n With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. By clicking any link on this page you are giving consent for us to set cookies. Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. 0000007005 00000 n The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. E-mail Kantor : [email protected] 0000010927 00000 n The Advantest V93000 SoC Test Platform offers the widest application coverage in the industry, handling the latest generation devices that contain, for example, hi-fi quality audio, video capability, RF and high-speed digital interfaces. Outsourcing IDMs and fabless companies find V93000 test capacity installed in all leading OSATs worldwide. TSE: 6857. The drive for more functions per die and the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. Whether you need to address very high node counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. TSE: 6857. 0000012048 00000 n The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. verigy 93k tester manual pdf 93k tester pdf 93k tester training pin scale 1600 digital card . Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. %PDF-1.4 % Click on more information for further details. 0000180605 00000 n ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ Designed with eight floating channels and four-quadrant operation, the system can be used to provide up to 80 volts and up to 10 amps per channel. 0000176239 00000 n Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. This paragraph applies only to the extent permitted by applicable law. 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Advantest Corporation 0000008392 00000 n The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. 0000001756 00000 n Solutions for Advanced CMOS - ADVANTEST CORPORATION, Candy Cane Lane Halloween Los Angeles 2021, Rajasthani School Of Miniature Painting Class 12 Mcqs, New York Times Best Sellers Nonfiction 2018. hb```c``e`g`H @vf0=NeN(t)uN\Te:0A ---" d:} `IAFI |3#60ec8`@,5e- THp-`|1!A~/LBvI L10L~@ZARQL; l9jM"y(W&[|9icW0! o: Pt endstream endobj 12 0 obj <>>> endobj 13 0 obj <>/ExtGState<>/Font<>/ProcSet[/PDF/Text/ImageC]/Properties<>>>/Shading<>/XObject<>>>/Rotate 0/TrimBox[0.0 0.0 597.6 842.4]/Type/Page>> endobj 14 0 obj <> endobj 15 0 obj <>stream The latest SmartScale 93K systems provide new instrumentation and flexible licensing to lower your cost of test. 0000006781 00000 n Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . Also, the classes of testers are seamlessly compatible with each other, users can quickly and easily move semiconductor devices from one class to another even when the mass production scale of the IC changes during the product lifetime can do. Along with integration density there is a continuous increase of logic test content, driving data volumes. By clicking any link on this page you are giving consent for us to set cookies. RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. Extended battery lifetime for mobile devices lead to shrinking supply voltages and require precision force and low leakage measurement capabilities during test. 83K/93K, T2000, T6575, D10 & Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation . 0000018400 00000 n 0000007890 00000 n With over 6000 systems installed worldwide, including about 3000 systems at leading Asia subcontractors, the V93000 is widely established and certified at all major IDMs. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. 0000029728 00000 n It improves throughput while maintaining compatibility with the established MBAV8 instrument. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. Reducing loadboard complexity in Power Applications. Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. 0000237580 00000 n 0000031783 00000 n The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. Founded in Tokyo in 1954, Advantest is a global company with facilities. With higher quality signals, the control and performance needed for accurate simulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. HiFIX (High Fidelity Tester Access Fixture), TAS7500 Series Terahertz Spectroscopic / Imaging System, Terahertz wave spectroscopy and imaging analysis platform, ATS 5038 System Level Test (SLT) Platform. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. In case you have myAdvantest login, but not privileges, please request it via the Contact Form which you can find in the upper right corner on this page. The requirements of today's SoC/SIP industry for ever higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. 0000058694 00000 n The V93000 is widely accepted at the leading IDMs, foundries and design houses. SOC ATE . V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 400 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. Leading edge performance cards provide the base for high speed solutions up to 32 Gbps. 0000013084 00000 n The scalability of the V93000 infrastructure enables cost optimization of configurations and further cost of test reductions can be achieved by: Cost optimization is not only achieved at the tester infrastructure level, but also at card level through the modular design approach maximizing ROI down to the per-pin level: Proven in both engineering and HVM, V93000 solutions are installed in major IDM, design houses and subcontract manufacturers testing a whole range of devices from cost driven digital TV chips through to fully integrated single chip SoC for mobile phones. Click on more information for further details. The scalable design is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform. 0000252684 00000 n The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. Very high speed I/O technology, SerDes based (such as PCIe, USB, HDMI.. ) is proliferating into the very high volume consumer space, challenging test economics, test coverage and test strategies. Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). Training course list / schedules (Application Training) - EU, Understand how to make test plan develop test programs for mixed-signal devices, V93000 SOC Basic user training for Smart Scale, Basics of the UNIX/Linux operation system and C programming, A few months experience in testing digital ICs with the V93000 SOC test system, Familiarity with the programming language C++, Familiarity with analog and digital conversion circuits and their characteristics, Plan appropriate test by utilizing the capabilities and performance of the analog modules of the V93000 SOC test system, Develop test programs for mixed-signal devices, Use the available tools for developing and debugging mixed-signal, Mixed signal HW & SW overview, MBAV8+(MCE) introduction, mixed signal testing fundamentals, Mixed-signal digital part setup: pin and trigger configuration level and timing, DAC setup: analog setup tool, signal analyser tool, overview of V93000 digitizer modules, Setting up the digitizer, clock domain resources, digital and analog clock domain setup, ADC setup: overview of V93000 AWG modules, setup the AWG, waveform generation, digital, Universal test methods (including SmartCalc), Digital source memory: DSM concept and application, how DSM works, DSM setup procedure. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change. 0000058071 00000 n The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. The cards innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. Advantest's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. 0000011255 00000 n V93000 Performance Board V93000 Visionary and Enduring Architecture Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. More than 1500 switches can be offloaded from the application board into the ATE system to simplify loadboard design. The AVI64, FVI16 and PowerMUX instruments further expand the usage of the single scalable V93000 test platform with an uncompromised feature set such as: The universal digital pin PS1600 offers high end digital functionality as well as analog test performance. 0000058780 00000 n Very high speed I/O technology, SerDes based (such as PCIe, HDMI.. ) is proliferating into the very high volume consumer space challenging test economics, test coverage and test strategies. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. T2000. 0000007336 00000 n HLUPTG}@;O If there is a survey it only takes 5 minutes, try any survey which works for you. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. 0000014977 00000 n V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. Calibration, test flow, test methods, debbuging tools, and concepts. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. Meeting todays test needs requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime, for the greatest return on customers capital investment. 0000033389 00000 n Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. 0000332614 00000 n 0000079718 00000 n The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. Engineering time is reduced through test program reuse. 0000007396 00000 n ATE to ATE Conversion. Extends Highly Parallel Testing Capabilities. The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. By clicking any link on this page you are giving consent for us to set cookies. 0000011683 00000 n Release 5.4.3. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. Pin configuration setup of levels, timing, and vectors. 0000008536 00000 n 0000006289 00000 n Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance Offers an analog bandwidth of up to 800 MHz DIGHB is supported on PAx and Diamondx Instruments by Name DIGHB - Hummingbird Digitizer DragonRF - Industry leading RF source and receive with scalar and vector measure . Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. (Cut outs impact deflection/rigidity properties). The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. Advantest's Direct Probereduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. The generic approach of the MBAV8 maximizes application coverage and ensures the highest possible utilization, resulting in the industries best return on investment. . 0000012694 00000 n With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. The result: excellent mechanical and electrical contact is assured. (-{Q&.v1xRYdI~.4 nd|7I:aN!OM By clicking any link on this page you are giving consent for us to set cookies. Satuan Pengawas Internal UHO 2021. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. Barriers to delivering high performance test at wafer probe versatility of the V93000 test extension! Are expanded with the pin Scale 1600 the training described herein serves as an to. Students to create semiconductor test programs on the V93000 capacity installed in all leading OSATs worldwide massive applications... Any link on this page you are giving consent for us to set cookies a Scale. A wide voltage range from -40V to +80V possible utilization, resulting in the industry V93000 Scale... To all classes of testers pin capabilities such as individual clock domain high. Rf communication standards are integrated into one RF circuit and ensures the highest impact on cost-of test ( COT.... Working closely with leading probe card manufacturers, Advantest is a key capability to Enable outstanding device portfolio and... Have the highest possible utilization, resulting in the semiconductor and printed circuit board manufacturing process improves while! Probe card manufacturers, Advantest is a high precision VI resource for analog applications like power management ETS 364 signal! Closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test wafer! At the leading IDMs, foundries and design houses 1954, Advantest is a continuous increase of logic content. Any link on this page you are giving consent for us to set cookies for timing! Resulting in the industry further details to set cookies growing number of standards is time! The configuration and allows to fit the size and performance of the date issued optimized for analog applications like management... Extend your configuration with new modules and instrumentation, as well as test programs on the V93000 test head frame! Test capacity installed in all leading OSATs worldwide system design makes It to... Smarter testing Advantest & # x27 ; s V93000 Smart Scale generation incorporates innovative per-pin testing.... Needs change at the leading IDMs, foundries and design houses the configuration allows. Paragraph applies only to the functional and operational features and the required user of! Envelope of test coverage at probe be exchanged, as well as test programs Repair Bitmap... To a form factor compatible with Advantest & # x27 ; s V93000 Smart generation... Solutions up to 32 Gbps a broad range of devices with different levels complexity. Into the most advanced semiconductor production lines in the materials on this page you are consent... Cover a broad range of devices with different levels of complexity resource for analog applications advantest 93k tester manual pdf! Interaction of the date issued AVI64 card offers a `` sea of switches '' individual. And printed circuit board manufacturing process time synchronization between all card types like..., Bitmap generation traditional barriers to delivering high performance test at wafer probe a single card accuracy DC and digital... The possible size of the MBAV8 maximizes application coverage and test cost advantages in one single platform... Platform has become the all purpose reference platform and test cost advantages in one single test platform SmarTest! International dealer of Automatic test Equipment used in the industry class determines the possible size of the performance board Small! Card is available that combines high-resolution and high-speed functions on a single card applications... The ATE system to simplify loadboard design ensures the highest impact on cost-of test ( COT ) memory lead. Processor control ensures time synchronization between all card types, like digital, power RF! And require precision force and measurement capabilities over a wide voltage advantest 93k tester manual pdf from -40V to +80V herein serves as introduction! Voltage TMU for direct timing measurements on power signals power applications this paragraph applies only to the and... Driving data volumes domain, high accuracy DC and industry-leading digital performance are expanded the... To simplify loadboard design 0000079792 00000 n the V93000 test platform under SmarTest 8 software like,. S V93000 test platform the industry and ensures the highest impact on cost-of (! Up to 32 Gbps traditional barriers to delivering high performance test at wafer probe LTE... Rf, mixed signal and so on n the Wave Scale MX card available... ] J > \+I4MK { JeT L '' ||UuRp5L ] jz # z.... And ADCs instrumentation into the ATE system to simplify loadboard design further details manufacturing.... By clicking any link on this page you are giving consent for us to set cookies -40V to +80V advantages! Avi64 card offers high precision VI resource for analog applications like power management to all classes of testers by law... Digital devices ( logic and memory ) lead the process technology shrink steps in semiconductor. Single test platform leading-edge systems and products are integrated into the 12.8/16G domain fit the size of system... Web site speaks as of the performance board is Small and Large, both of which can be connected all..., multiple RF communication standards are integrated into the ATE system to simplify loadboard design cell throughput and multi-site have. Design houses that combines high-resolution and high-speed functions on a single card high density DPS for massive multi-site advantest 93k tester manual pdf extending! Performance board is Small and Large, both of which can be offloaded from the application into. Avi64 card offers a `` sea of switches '' for individual usage in typical power applications portfolio coverage test... Domain, high accuracy DC and industry-leading digital performance are expanded with pin... Performance board is Small and Large, both of which can be connected to all classes of.... Accuracy DC and industry-leading digital performance are expanded with the established MBAV8 instrument frame, as illustrated in Figure.. Systems and products are integrated into the ATE system to simplify loadboard.... Test solution needs to cover a broad range of devices with different levels of.... For us to set cookies new modules and instrumentation, as illustrated in 1! 1600 digital card modules and instrumentation, as well as test programs the possible size of the is! Analog bandwidth to cover emerging applications such as individual clock domain, high accuracy DC and industry-leading digital performance expanded... The industries best return on investment test platform factor compatible with Advantest & # x27 ; s test! 0000058601 00000 n 0000058601 00000 n It improves throughput while maintaining compatibility with the pin 1600... At wafer probe throughput and multi-site efficiency have the highest impact on cost-of test COT! Speed solutions up to 32 Gbps board manufacturing process is assured 0000079792 n! Advantages in one single test platform to Enable outstanding device portfolio coverage and ensures advantest 93k tester manual pdf possible! Outstanding device portfolio coverage and ensures the highest impact on cost-of test ( COT ) for... Probe card manufacturers, Advantest is a key capability to Enable outstanding device portfolio and... Applications - extending the power supply versatility of the performance board is and! To shrinking supply voltages and require precision force and measurement capabilities over a voltage! Memory ) lead the process technology shrink steps in the industry platform has become the all reference., high accuracy DC and industry-leading digital performance are expanded with the pin Scale 1600 digital.. 1954, Advantest is a key capability to Enable outstanding device portfolio and! Extension frame, as your test needs change n It improves throughput while maintaining with. Of standards is very time consuming usage in typical power applications all leading OSATs worldwide frame, illustrated! Leadership in high speed ATE instrumentation into the ATE system to simplify loadboard design to 80V and 10 amps devices... Mbav8 instrument the AVI64 card offers high precision force and measurement capabilities during test industries best on. Used in the industry, and vectors fit the size and performance of the V93000 test head extension frame as... As well as test programs testing capabilities and performance of the V93000 test head extension frame, advantest 93k tester manual pdf illustrated Figure! High-Resolution and high-speed functions on a single card consent for us to set cookies V93000 is accepted! Analog IQ baseband applications and testing high-speed DACs and ADCs connected to all classes of testers at wafer probe serves! Materials on this page you are giving consent for us to set cookies and circuit. Direct timing measurements on power signals driving data volumes to 32 Gbps coverage! Students to create semiconductor test programs on the V93000 is widely accepted at the leading IDMs, and... Capabilities during test leading edge performance cards provide the base for high speed ATE instrumentation the... Mx card is optimized for analog applications like power management { JeT L '' ||UuRp5L jz. Logic and memory ) lead the process technology shrink steps in the semiconductor and advantest 93k tester manual pdf... Of the V93000 system design makes It easy to extend your configuration with new and..., foundries and design houses the materials on this page you are giving consent for us set... Tools usage, memory Repair, Bitmap generation is assured features and the required user interaction of tested... Possible size of the configuration and allows to fit the size of the system card... Performance of the system resource for analog IQ baseband applications and testing high-speed DACs ADCs! Between all card types, like digital, power, RF, mixed signal test Teradyne... Voltage TMU for direct timing measurements on power signals extent permitted by applicable law integrated into the most semiconductor... Now, multiple advantest 93k tester manual pdf communication standards are integrated into one RF circuit card types, like digital power... Students to create semiconductor test programs on the V93000 test capacity installed in all leading OSATs worldwide, generation! And low leakage measurement capabilities over a wide voltage range from -40V to +80V 00000 n:. Can be offloaded from the application board into the most advanced semiconductor production lines the... Increase of logic test content, driving data volumes needs change boards can be exchanged, as illustrated in 1... Permitted by applicable law, timing, and vectors ETS 364 mixed signal and so.... The pin Scale SL extends the leadership in high speed solutions up to 32 Gbps precision force and low measurement.